外观 | 制造商零件编号 | 制造商 | 描述 | 封装/外壳 | 包装 | ROHS |
---|---|---|---|---|---|---|
S-89220ACNC-1C1TFG |
Seiko Instruments | 校验器 IC Single Low Voltage | - | - | - | |
S-89511ALMD-HN6-TF |
Seiko Instruments | 校验器 IC SOT-23-6 SINGLE COMP | - | - | - | |
S-89530ACNC-HCB-TF |
Seiko Instruments | 校验器 IC Single Rail-to-Rail | - | - | - | |
S-89220ACNC-1C1-TF |
Seiko Instruments | 校验器 IC Single Low Voltage | - | - | - | |
S-89210ACNC-1C0-TF |
Seiko Instruments | 校验器 IC 4mV 50uA 1.8-5.5V | - | - | - | |
SED1335FOA |
Seiko Instruments | LCD 驱动器 SMOS Controller Chip | - | - | - | |
S-75V00ANC-5V1-TFG |
Seiko Instruments | 门(与/非与/或/非或) 2-Input NAND Gate | - | - | - | |
S-75L08ANC-5L2-TFG |
Seiko Instruments | 门(与/非与/或/非或) 2-Input AND Gate | - | - | - | |
S-75L08ANC-5L2-TF |
Seiko Instruments | 门(与/非与/或/非或) 2-Input AND Gate | - | - | - | |
S-75L86ANC-5L8-TF |
Seiko Instruments | 门(与/非与/或/非或) Exclusive OR Gate | - | - | - | |
S-75L00ANC-5L1-TF |
Seiko Instruments | 门(与/非与/或/非或) 2-In NAND Gate | - | - | - | |
S-75L02ANC-5L3-TF |
Seiko Instruments | 门(与/非与/或/非或) 2-In NOR Gate | - | - | - | |
S-75L32ANC-5L4-TF |
Seiko Instruments | 门(与/非与/或/非或) 2-Input OR Gate | - | - | - | |
S-75V02ANC-5V3-TFG |
Seiko Instruments | 门(与/非与/或/非或) 2-Input NOR Gate | - | - | - | |
S-75L00ANC-5L1-TFG |
Seiko Instruments | 门(与/非与/或/非或) 2-In NAND Gate | - | - | - |