| 外观 | 制造商零件编号 | 制造商 | 描述 | 封装/外壳 | 包装 | ROHS |
|---|---|---|---|---|---|---|
|
S-89210ACNC-1C0TFG |
Seiko Instruments | 校验器 IC 4mV 50uA 1.8-5.5V | - | - | - |
|
|
S-89531BCPN-HFC-TF |
Seiko Instruments | 校验器 IC Dual Comparator | - | - | - |
|
|
S-89531ACNC-HCC-TF |
Seiko Instruments | 校验器 IC Single Comparator | - | - | - |
|
|
S-89530ACNC-HCBTFG |
Seiko Instruments | 校验器 IC Single Rail-to-Rail | - | - | - |
|
|
S-89220ACNC-1C1TFG |
Seiko Instruments | 校验器 IC Single Low Voltage | - | - | - |
|
|
S-89511ALMD-HN6-TF |
Seiko Instruments | 校验器 IC SOT-23-6 SINGLE COMP | - | - | - |
|
|
S-89530ACNC-HCB-TF |
Seiko Instruments | 校验器 IC Single Rail-to-Rail | - | - | - |
|
|
S-89220ACNC-1C1-TF |
Seiko Instruments | 校验器 IC Single Low Voltage | - | - | - |
|
|
S-89210ACNC-1C0-TF |
Seiko Instruments | 校验器 IC 4mV 50uA 1.8-5.5V | - | - | - |
|
|
SED1335FOA |
Seiko Instruments | LCD 驱动器 SMOS Controller Chip | - | - | - |
|
|
S-75V00ANC-5V1-TFG |
Seiko Instruments | 门（与/非与/或/非或） 2-Input NAND Gate | - | - | - |
|
|
S-75L08ANC-5L2-TFG |
Seiko Instruments | 门（与/非与/或/非或） 2-Input AND Gate | - | - | - |
|
|
S-75L08ANC-5L2-TF |
Seiko Instruments | 门（与/非与/或/非或） 2-Input AND Gate | - | - | - |
|
|
S-75L86ANC-5L8-TF |
Seiko Instruments | 门（与/非与/或/非或） Exclusive OR Gate | - | - | - |
|
|
S-75L00ANC-5L1-TF |
Seiko Instruments | 门（与/非与/或/非或） 2-In NAND Gate | - | - | - |