| 外观 | 制造商零件编号 | 制造商 | 描述 | 封装/外壳 | 包装 | ROHS |
|---|---|---|---|---|---|---|
|
ICT-100-V-5.5-G S/C |
IDI | Test Probes 4-POINT CROWN | - | - | - |
|
|
S-075-J-7-G |
IDI | Test Probes HEADLESS RADIUS | - | - | - |
|
|
SS-50-H-5.1-G S/C |
IDI | Test Probes HEADED SERRATED | - | - | - |
|
|
SS-19-3.8-G S/C W/HOLE .400 OAL |
IDI | Test Probes HEADLESS SERRATED W/HOLE .400 | - | - | - |
|
|
SS-11-7-G S/C W/HOLE .385 OAL |
IDI | Test Probes HEADLESS FLAT SPEAR | - | - | - |
|
|
S-1-E-3.8-G D/C .670 OAL |
IDI | Test Probes HEADED RADIUS | - | - | - |
|
|
SS-50-ES-2.9-G D/C |
IDI | Test Probes 90 DEG CONVEX PROBE | - | - | - |
|
|
S-100-V8-8-G |
IDI | Test Probes HEADED 8 PT CRWN | - | - | - |
|
|
S-075-M-7-G-S |
IDI | Test Probes HEADLESS BLADE | - | - | - |
|
|
S-2-X-4-G S/C |
IDI | Test Probes HEADED 4PT TAPERED CROWN | - | - | - |
|
|
S-2-X-10-G D/C |
IDI | Test Probes HEADED 4PT TAPERED CROWN | - | - | - |
|
|
ICT-100-W-5.5-G S/C |
IDI | Test Probes 4-POINT CROWN | - | - | - |
|
|
S-50J-B-5.6-DG-S |
IDI | Test Probes HDLESS 30 DEG SPEAR STEEL | - | - | - |
|
|
ICT-100-J-6.7-G S/C |
IDI | Test Probes .10 CTR 3 AMP PROBE RADIUS | - | - | - |
|
|
S-50J-SP-7-DG-S |
IDI | Test Probes HEADLESS CHISELED SPEAR STEEL | - | - | - |