| 描述 | Test Probes HEADED RADIUS | 设备类型 | Probe |
|---|---|---|---|
| 触点电镀 | Gold over Nickel | 电流额定值 | 3 A |
| 特点 | Gold over nickel plated | 长度 | 33.27 mm |
【IDI】ICT-100-D-5.5-G S/C,Test Probes .10 CTR 3 AMP PROBE HEADED RADIUS
【IDI】ICT-100-D-6.7-G S/C,Test Probes ICT 100 SERIES PROBE BeCu PLUNGER TIP
【IDI】ICT-100-D-8-G S/C,触点探头 .10 CTR 3 AMP PROBE HEADED RADIUS
【IDI】ICT-100-F-10-G S/C,触点探头 .10 CTR 3 AMP PROBE HEADED FLAT
【IDI】ICT-100-F-17-G S/C,Test Probes .10 CTR 3 AMP PROBE HEADED FLAT
【IDI】ICT-100-F-5.5-G S/C,触点探头 .10 CTR 3 AMP PROBE HEADED FLAT
【IDI】ICT-100-F-6.7-G S/C,Test Probes .10 CTR 3 AMP PROBE HEADED FLAT