| 描述 | Test Probes HEADLESS RADIUS | 设备类型 | Probe |
|---|---|---|---|
| 触点电镀 | Gold | 电流额定值 | 3 A |
| 特点 | Gold plated | 长度 | 15.75 mm |
【IDI】SS-75-J-4.9-D D/C .620 OAL,触点探头 HEADLESS RADIUS .620 LENGTH
【IDI】SS-75-J-4.9-G D/C .620 OAL,Test Probes HEADLESS RADIUS .620 LENGTH
【IDI】SS-75-K-2.4-D D/C .620 OAL,触点探头 HEADED 45 DEG 4 SIDE CHISEL, .620LENGTH
【IDI】SS-75-K-2.4-G D/C .620 OAL,Test Probes HEADED 45 DEG 4 SIDE CHISEL, .620LENGTH
【IDI】SS-75-K-4.9-D D/C .620 OAL,Test Probes HEADED 45 DEG 4 SIDE CHISEL, .620LENGTH
【IDI】SS-75-K-4.9-G D/C .620 OAL,Test Probes HEADED 45 DEG 4 SIDE CHISEL, .620LENGTH
【IDI】SS-75-U-2.4-D D/C .620 OAL,触点探头 HEADLESS 4PT CROWN .620 LENGTH
【IDI】SS-75-U-2.4-G D/C .620 OAL,Test Probes HEADLESS 4PT CROWN .620 LENGTH