| 描述 | Test Connectors HEADED SERRATED |
|---|
【IDI】SX-0-H-2.5-G D/C,触点探头 HEADED SERRATED IMPROVE PT ACCURACY
【IDI】SX-0-H-3.7-G D/C,Test Probes HEADED SERRATED IMPROVE PT ACCURACY
【IDI】SX-0-J-2.2-D D/C,触点探头 HEADLESS RADIUS IMPROVE PT ACCURACY
【IDI】SX-0-J-2.2-G D/C,触点探头 HEADLESS RADIUS IMPROVE PT ACCURACY
【IDI】SX-0-J-2.5-D D/C,触点探头 HEADLESS RADIUS IMPROVE PT ACCURACY
【IDI】SX-0-J-2.5-G D/C,触点探头 HEADLESS RADIUS IMPROVE PT ACCURACY
【IDI】SX-0-J-3.7-D D/C,触点探头 HEADLESS RADIUS IMPROVE PT ACCURACY
【IDI】SX-0-J-3.7-G D/C,触点探头 HEADLESS RADIUS IMPROVE PT ACCURACY