| 外观 | 制造商零件编号 | 制造商 | 描述 | 封装/外壳 | 包装 | ROHS |
|---|---|---|---|---|---|---|
|
SS-75-H-4.9-G D/C .620 OAL |
IDI | Test Probes HEADED SERRATED .620 LENGTH | - | - | - |
|
|
SS-1-3.8-G S/C W/HOLE .385 OAL |
IDI | Test Probes CONTACT PROBE | - | - | - |
|
|
ICT-075-U-5-G S/C |
IDI | Test Probes .075' CTR 3AMP PROBE 4 PT CRWN | - | - | - |
|
|
S-0-T4-2.5-G S/C |
IDI | Test Probes HEADED 45 DEG CHISEL | - | - | - |
|
|
S-50J-A-5.6-DG |
IDI | Test Probes HEADED 90 DEG CONVEX | - | - | - |
|
|
S-1-K-6.6-G D/C .670 OAL |
IDI | Test Probes HEADED 4 SIDED CHISEL | - | - | - |
|
|
SH-5-A-18.7-G S/C |
IDI | Test Probes HEADED CUP PROBE | - | - | - |
|
|
ICT-50C-J-5.6-DG |
IDI | Test Probes HEADLESS RADIUS | - | - | - |
|
|
S-100-T-6.7-G |
IDI | Test Probes 60 DEG CHISELED PROBE | - | - | - |
|
|
S-1-C-2-G D/C .670 OAL |
IDI | Test Probes HEADLESS FLAT | - | - | - |
|
|
S-100-S-5.5-G-S |
IDI | Test Probes S100 SERIES BECU PLUNGER | - | - | - |
|
|
DE-SO-J-2.4-G-180 |
IDI | Test Probes DOUBLE ENDED PROBE | - | - | - |
|
|
ICT-100-T-17-G S/C |
IDI | Test Probes .10 CTR 3 AMP PROBE 60 DEG CHSL | - | - | - |
|
|
S-0-H-3.7-G S/C |
IDI | Test Probes HEADED SERRATED | - | - | - |
|
|
S-075-VLT-5-G-S |
IDI | Test Probes HEADED REDUCED 4 PT | - | - | - |