| 外观 | 制造商零件编号 | 制造商 | 描述 | 封装/外壳 | 包装 | ROHS |
|---|---|---|---|---|---|---|
|
SS-50-T4-2.9-G S/C |
IDI | Test Probes HEADED 45 DEG CHISEL 0.035 | - | - | - |
|
|
S-00-U-1.6-D D/C |
IDI | Test Probes HEADLESS 4 PT CRWN | - | - | - |
|
|
ICT-100-HSC-5.5-G S/C |
IDI | Test Probes .10 CTR 3 AMP PROBE INSULATED PLNG... | - | - | - |
|
|
S-2-V-4-G S/C |
IDI | Test Probes 4-POINT CROWN | - | - | - |
|
|
S-100-G-5.5-G |
IDI | Test Probes BECU PLUNGER | - | - | - |
|
|
S-075-U-5-G-S |
IDI | Test Probes HEADLESS 4 PT CRWN STEEL | - | - | - |
|
|
S-075-UR-10-G-S |
IDI | Test Probes REDUCED 4 PT CROWN STEEL | - | - | - |
|
|
ICT-50C-J-4.3-DG |
IDI | Test Probes HEADLESS RADIUS | - | - | - |
|
|
S-1-E-2-G D/C .670 OAL |
IDI | Test Probes BeCu PLUNGER .67X.04 2oz | - | - | - |
|
|
DE-50-U-2-G |
IDI | Test Probes DOUBLE ENDED PROBE SIZE 50 | - | - | - |
|
|
ICT-50J-V8-7-DG |
IDI | Test Probes HEADED 8 PT CRWN | - | - | - |
|
|
ICT-100-D-5.5-G S/C |
IDI | Test Probes .10 CTR 3 AMP PROBE HEADED RADIUS | - | - | - |
|
|
SS-30-B-1.6-G D/C |
IDI | Test Probes HDLESS 30 DEG SPEAR | - | - | - |
|
|
S-100-SP-17-G-S |
IDI | Test Probes HEADLESS CHSLD SPEAR STEEL | - | - | - |
|
|
S-100-G-10-G |
IDI | Test Probes HEADLESS CONCAVE | - | - | - |